Applied Statistics in Business & Economics 2e provides a comprehensive introduction to Statistics concepts and applications in business and economics. The text and Student CD provide state of the art integration of technology in order to focus on the important practical concepts and applications as opposed to mechanics.
Auflage
Sprache
Verlagsort
Verlagsgruppe
McGraw-Hill Education - Europe
Illustrationen
Tables, color; Illustrations, color
Maße
Höhe: 282 mm
Breite: 216 mm
Dicke: 38 mm
Gewicht
ISBN-13
978-0-07-721484-5 (9780077214845)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
David P. Doane is Professor of Quantitative Methods in Oakland University's Department of Decision and Information Sciences. He earned his Bachelor of Arts degree in mathematics and economics at the University of Kansas and his PhD from Purdue University's Krannert Graduate School.
Lori E. Seward is an Instructor in the Decisions Sciences Department in the College of Business at The University of Colorado at Denver and Health Sciences Center. She earned her Bachelor of Science and Master of Science degrees in Industrial Engineering at Virginia Tech. After several years working as a reliability and quality engineer in the paper and automotive industries, she earned her PhD from Virginia Tech.
Chapter One Overview of StatisticsChapter Two Data CollectionChapter Three Describing Data VisuallyChapter Four Descriptive StatisticsChapter Five ProbabilityChapter Six Discrete Probability DistributionsChapter Seven Continuous DistributionsChapter Eight Sampling Distributions and EstimationChapter Nine One Sample Hypothesis TestsChapter Ten Two Sample Hypothesis TestsChapter Eleven Analysis of VarianceChapter Twelve Bivariate RegressionChapter Thirteen Multiple RegressionChapter Fourteen Time Series AnalysisChapter Fifteen Chi-Square TestsChapter Sixteen Nonparametric TestsChapter Seventeen Quality ManagementOn CD:Chapter Eighteen Simulation