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Your search for Philippe Pougnet

  1. Cover: Applications and Metrology at Nanometer Scale 1 - Wiley-IEEE Press
    Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Applications and Metrology at Nanometer Scale 1
    Smart Materials, Electromagnetic Waves and Uncertainties
    01/2021
    1st EDN1st Edition
    Wiley-IEEE Press
    9781119808145 (ISBN)
    E-Book
    ePUB
    Other editions
    €139.99
    Available for download
  2. Cover: Applications and Metrology at Nanometer-Scale 2 - Polity
    Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Applications and Metrology at Nanometer-Scale 2
    Measurement Systems, Quantum Engineering and RBDO Method
    03/2021
    1st EDN1st Edition
    Polity
    9781119818960 (ISBN)
    E-Book
    PDF
    Other editions
    €139.99
    Available for download
  3. Cover: Applications and Metrology at Nanometer Scale 1 - Wiley-IEEE Press
    Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Applications and Metrology at Nanometer Scale 1
    Smart Materials, Electromagnetic Waves and Uncertainties
    01/2021
    1st EDN1st Edition
    Wiley-IEEE Press
    9781119808220 (ISBN)
    E-Book
    PDF
    Other editions
    €139.99
    Available for download
  4. Cover: Applications and Metrology at Nanometer-Scale 2 - Wiley-Scrivener
    Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Applications and Metrology at Nanometer-Scale 2
    Measurement Systems, Quantum Engineering and RBDO Method
    04/2021
    1st EDN1st Edition
    Wiley-Scrivener
    9781119818977 (ISBN)
    E-Book
    ePUB
    Other editions
    €139.99
    Available for download
  5. Cover: Nanometer-scale Defect Detection Using Polarized Light - Wiley-ISTE
    Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Nanometer-scale Defect Detection Using Polarized Light
    08/2016
    Wiley-ISTE
    9781119329688 (ISBN)
    E-Book
    ePUBPDF
    Other editions
    €139.99
    Available for download
  6. Cover: Embedded Mechatronic Systems 2 - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems 2
    Analysis of Failures, Modeling, Simulation and Optimization
    02/2020
    2nd EDN2nd Edition
    Elsevier
    9780081019566 (ISBN)
    E-Book
    ePUB
    Other editions
    €92.95
    Available for download
  7. Cover: Nanometer-scale Defect Detection Using Polarized Light - Wiley-ISTE
    Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Nanometer-scale Defect Detection Using Polarized Light
    08/2016
    Wiley-ISTE
    9781119329657 (ISBN)
    E-Book
    ePUBPDF
    Other editions
    €139.99
    Available for download
  8. Cover: Embedded Mechatronic Systems - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems
    Analysis of Failures, Predictive Reliability
    11/2019
    2nd EDN2nd Edition
    Elsevier
    9780081019559 (ISBN)
    E-Book
    ePUB
    Other editions
    €92.95
    Available for download
  9. Cover: Embedded Mechatronic Systems, Volume 2 - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems, Volume 2
    Analysis of Failures, Modeling, Simulation and Optimization
    07/2015
    Elsevier
    9780081004692 (ISBN)
    E-Book
    ePUB
    Other editions
    €92.95
    Available for download
  10. Cover: Embedded Mechatronic Systems, Volume 1 - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems, Volume 1
    Analysis of Failures, Predictive Reliability
    07/2015
    Elsevier
    9780081004845 (ISBN)
    E-Book
    ePUB
    Other editions
    €92.65
    Available for download
  11. Cover: Nanometer-scale Defect Detection Using Polarized Light - Wiley-ISTE
    Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Nanometer-scale Defect Detection Using Polarized Light
    08/2016
    1st EDN1st Edition
    Wiley-ISTE
    9781848219366 (ISBN)
    Book
    Hardback
    Other editions
    €164.50
    Shipment within 15-20 days
  12. Cover: Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties - ISTE Ltd
    Pierre Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
    Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
    Smart Materials, Electromagnetic Waves and Uncertainties
    05/2021
    1st EDN1st Edition
    ISTE Ltd
    9781786306401 (ISBN)
    Book
    Hardback
    Other editions
    €164.50
    Shipment within 3-4 weeks
  13. Cover: Embedded Mechatronic Systems, Volume 1 - ISTE Press - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems, Volume 1
    Analysis of Failures, Predictive Reliability
    07/2015
    ISTE Press - Elsevier
    9781785480133 (ISBN)
    Book
    Hardback
    Other editions
    €133.70
    Exhausted; check for reprint
    New edition available
  14. Cover: Embedded Mechatronic Systems, Volume 2 - ISTE Press - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems, Volume 2
    Analysis of Failures, Modeling, Simulation and Optimization
    07/2015
    ISTE Press - Elsevier
    9781785480140 (ISBN)
    Book
    Hardback
    Other editions
    €133.70
    Exhausted; check for reprint
    New edition available
  15. Cover: Embedded Mechatronic Systems 2 - ISTE Press - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems 2
    Analysis of Failures, Modeling, Simulation and Optimization
    03/2020
    2nd EDN2nd Edition
    ISTE Press - Elsevier
    9781785481901 (ISBN)
    Book
    Hardback
    Other editions
    €97.80
    Shipment within 3-4 weeks
  16. Cover: Embedded Mechatronic Systems - ISTE Press - Elsevier
    Abdelkhalak El Hami | Philippe Pougnet
    Embedded Mechatronic Systems
    Analysis of Failures, Predictive Reliability
    11/2019
    2nd EDN2nd Edition
    ISTE Press - Elsevier
    9781785481895 (ISBN)
    Book
    Hardback
    Other editions
    €96.50
    Shipment within 3-4 weeks
  17. This image is currently not available.
    Pierre Richard Dahoo | Philippe Pougnet
    Applications et metrologie a l'echelle nanometrique 2
    systemes de mesure, ingenierie quantique et methodes d'optimisation fiabiliste
    12/2021
    Hermes Science Publishing Ltd
    9781784057947 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €111.61
    Shipment within 3-4 weeks
  18. This image is currently not available.
    Pierre Richard Dahoo | Philippe Pougnet
    Applications et metrologie a l'echelle nanometrique 1
    materiaux intelligents, onde electromagnetique et incertitudes
    12/2021
    Hermes Science Publishing Ltd
    9781784057930 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €111.61
    Shipment within 3-4 weeks
  19. This image is currently not available.
    Abdelkhalak El Hami | Philippe Pougnet
    Les systemes mecatroniques embarques 2
    Analyse des causes de defaillances, modelisation, simulation et optimisation - 2e edition revue et augmentee
    01/2020
    Hermes Science Publishing Ltd
    9781784056476 (ISBN)
    Book
    Other editions
    €107.90
    Shipment within 3-4 weeks
  20. This image is currently not available.
    Abdelkhalak El Hami | Philippe Pougnet
    Les systemes mecatroniques embarques 1
    Analyse des causes de defaillances, fiabilite et contraintes - 2e edition revue et augmentee
    01/2020
    Hermes Science Publishing Ltd
    9781784056469 (ISBN)
    Book
    Other editions
    €107.90
    Shipment within 3-4 weeks
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