
Embedded Mechatronic Systems, Volume 1
Analysis of Failures, Predictive Reliability
ISTE Press - Elsevier
Published on 16. July 2015
Book
Hardback
262 pages
978-1-78548-013-3 (ISBN)
Article exhausted; check for reprint
Description
In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components which induce failure mechanisms should be identified and modeled for better control. AUDACE is a collaborative project of the cluster Mov'eo that address issues specific to mechatronic reliability embedded systems. AUDACE means analyzing the causes of failure of components of mechatronic systems onboard. The goal of the project is to optimize the design of mechatronic devices by reliability.
The project brings together public sector laboratories that have expertise in analysis and modeling of failure, major groups of mechatronics (Valeo and Thales) in the automotive and aerospace and small and medium enterprises that have skills in characterization and validation tests
The project brings together public sector laboratories that have expertise in analysis and modeling of failure, major groups of mechatronics (Valeo and Thales) in the automotive and aerospace and small and medium enterprises that have skills in characterization and validation tests
More details
Language
English
Place of publication
United Kingdom
Target group
Professional and scholarly
Academics and students (masters and doctoral students), teachers and researchers, industry Major Groups and SMEs in the automotive and aerospace sectors.
Dimensions
Height: 229 mm
Width: 152 mm
Weight
520 gr
ISBN-13
978-1-78548-013-3 (9781785480133)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
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Abdelkhalak El Hami | Philippe Pougnet
Embedded Mechatronic Systems
Analysis of Failures, Predictive Reliability
Book
11/2019
2nd Edition
ISTE Press - Elsevier
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Additional editions

Abdelkhalak El Hami | Philippe Pougnet
Embedded Mechatronic Systems, Volume 1
Analysis of Failures, Predictive Reliability
E-Book
07/2015
Elsevier
€92.65
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Persons
Abdelkhalak El Hami is Professeur des universites at the Institut National des Sciences Appliquees (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid-structure interaction studies, reliability and optimization.
Editor
Institut National des Sciences Appliquees (INSA-Rouen), France
Reliability Expert, Valeo, Paris, France
Content
1. Predictive Reliability of Embedded Electronic Systems
2. Measuring Method of the Internal Temperature of Electronic Components
3. Dynamic Analysis of Mechatronic Components by Laser Vibrometry
4. Measurement of Static and Vibratory Deformations and Displacements by Full Field Methods
5. Characterization of the Electromagnetic Environment of Microwave Frequency Circuits
6. Characterization of the Behavior of Radiofrequency Power Transistors under Thermal and Electromagnetic Stresses
7. Characterization of the Ability of Switching Transistors to Resist to Electrical Overstress
8. Spectroscopy of Non-destructive Characterizations of the Interface Physics of Mechatronics Devices
9. Study of the Dynamic Contact between Deformable Solids
2. Measuring Method of the Internal Temperature of Electronic Components
3. Dynamic Analysis of Mechatronic Components by Laser Vibrometry
4. Measurement of Static and Vibratory Deformations and Displacements by Full Field Methods
5. Characterization of the Electromagnetic Environment of Microwave Frequency Circuits
6. Characterization of the Behavior of Radiofrequency Power Transistors under Thermal and Electromagnetic Stresses
7. Characterization of the Ability of Switching Transistors to Resist to Electrical Overstress
8. Spectroscopy of Non-destructive Characterizations of the Interface Physics of Mechatronics Devices
9. Study of the Dynamic Contact between Deformable Solids