Cover: Nanometer-scale Defect Detection Using Polarized Light - Wiley-ISTE

Nanometer-scale Defect Detection Using Polarized Light

Published on 16. August 2016
316 pages
E-Book
PDF with Adobe-DRM
978-1-119-32965-7 (ISBN)
€139.99incl. 7% vat
System requirements
for PDF with Adobe-DRM
E-Book Single Licence
Available for download

Description

More details

Other editions

Persons

Content

System requirements