Nanometer-scale Defect Detection Using Polarized Light
Published on 16. September 2016
Software
Other digital
316 pages
978-1-119-32963-3 (ISBN)
More details
Language
English
Place of publication
Hoboken
United Kingdom
Publishing group
John Wiley and Sons Ltd
Target group
Professional and scholarly
Dimensions
Height: 250 mm
Width: 150 mm
Thickness: 15 mm
Weight
666 gr
ISBN-13
978-1-119-32963-3 (9781119329633)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
Nanometer-scale Defect Detection Using Polarized Light
E-Book
08/2016
Wiley-ISTE
€139.99
Available for download
Pierre-Richard Dahoo | Philippe Pougnet | Abdelkhalak El Hami
Nanometer-scale Defect Detection Using Polarized Light
E-Book
08/2016
Wiley-ISTE
€139.99
Available for download