Cover: Nanometer-scale Defect Detection Using Polarized Light - Wiley-ISTE

Nanometer-scale Defect Detection Using Polarized Light

1st Edition
Published on 12. August 2016
Book
Hardback
320 pages
978-1-84821-936-6 (ISBN)
€164.50incl. 7% vat
Shipment within 15-20 days

Description

More details

Other editions

Persons

Content