Transmission Electron Microscopy
Physics of Image Formation and Microanalysis
3rd Edition
Published on 29. September 1993
Book
Paperback/Softback
XIV, 545 pages
978-3-540-56849-0 (ISBN)
Description
Hier steht der Extremkurztext.
More details
Series
Edition
3rd ed.
Language
English
Place of publication
Heidelberg
Germany
Publishing group
Springer Berlin
Target group
College/higher education
Professional and scholarly
Edition type
Revised edition
Product notice
Paperback (UK-trade)
Illustrations
biography
Dimensions
Height: 23.5 cm
Width: 15.5 cm
Weight
845 gr
ISBN-13
978-3-540-56849-0 (9783540568490)
DOI
10.1007/978-3-662-21556-2
Schweitzer Classification
Other editions
New editions
Book
04/1997
4th Edition
Springer
€85.59
Article exhausted; check for reprint
Previous edition
Book
05/1989
2nd Edition
Springer
€85.59
Article exhausted; check for reprint
Persons
Content
1. Introduction.- 2. Particle Optics of Electrons.- 3. Wave Optics of Electrons.- 4. Elements of a Transmission Electron Microscope.- 5. Electron-Specimen Interactions.- 6. Scattering and Phase Contrast for Amorphous Specimens.- 7. Kinematical and Dynamical Theory of Electron Diffraction.- 8. Diffraction Contrast and Crystal-Structure Imaging.- 9. Analytical Electron Microscopy.- 10. Specimen Damage by Electron Irradiation.- References.