
Transmission Electron Microscopy
Physics of Image Formation and Microanalysis
Ludwig Reimer(Author)
Springer (Publisher)
4th Edition
Published on 17. April 1997
Book
Hardback
XVI, 587 pages
978-3-540-62568-1 (ISBN)
Article exhausted; check for reprint
Description
Transmission Electron Microscopy
presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.
More details
Series
Edition
4th ed.
Language
English
Place of publication
Heidelberg
Germany
Publishing group
Springer Berlin
Target group
Professional and scholarly
Illustrations
185 s/w Abbildungen
263 figures, references, index
Dimensions
Height: 23.5 cm
Width: 15.5 cm
Weight
1025 gr
ISBN-13
978-3-540-62568-1 (9783540625681)
DOI
10.1007/978-3-662-14824-2
Schweitzer Classification
Other editions
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08/2008
5th Edition
Springer
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Book
09/1993
3rd Edition
Springer
€85.59
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Content
1. Introduction.- 2. Particle Optics of Electrons.- 3. Wave Optics of Electrons.- 4. Elements of a Transmission Electron Microscope.- 5. Electron-Specimen Interactions.- 6. Scattering and Phase Contrast for Amorphous Specimens.- 7. Theory of Electron Diffraction.- 8. Electron Diffraction Modes and Applications.- 9. Imaging of Crystalline Specimens and Their Defects.- 10. Elemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy.- 11. Specimen Damage by Electron Irradiation.- References.