Transmission Electron Microscopy
Physics of Image Formation and Microanalysis
2nd Edition
Published on 19. May 1989
Book
Paperback/Softback
XIII, 547 pages
978-3-540-50499-3 (ISBN)
Description
The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy.
More details
Series
Edition
2nd ed.
Language
English
Place of publication
Heidelberg
Germany
Publishing group
Springer Berlin
Target group
College/higher education
Professional and scholarly
Illustrations
127 s/w Abbildungen
Dimensions
Height: 23.5 cm
Width: 15.5 cm
Weight
840 gr
ISBN-13
978-3-540-50499-3 (9783540504993)
DOI
10.1007/978-3-662-21579-1
Schweitzer Classification
Other editions
New editions
Book
09/1993
3rd Edition
Springer
€85.59
Article exhausted; check for reprint
Previous edition
Book
11/1983
Springer
€85.59
Article exhausted; check for reprint
Persons
Content
1. Introduction.- 2. Particle Optics of Electrons.- 3. Wave Optics of Electrons.- 4. Elements of a Transmission Electron Microscope.- 5. Electron-Specimen Interactions.- 6. Scattering and Phase Contrast for Amorphous Specimens.- 7. Kinematical and Dynamical Theory of Electron Diffraction.- 8. Diffraction Contrast and Crystal-Structure Imaging.- 9. Analytical Electron Microscopy.- 10. Specimen Damage by Electron Irradiation.- References.