
Run-to-Run Control in Semiconductor Manufacturing
CRC Press
1st Edition
Published on 30. November 2000
Book
Hardback
350 pages
978-0-8493-1178-9 (ISBN)
Description
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
More details
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
Professional and scholarly
Illustrations
27 s/w Tabellen
27 Tables, black and white
Dimensions
Height: 234 mm
Width: 156 mm
Weight
625 gr
ISBN-13
978-0-8493-1178-9 (9780849311789)
Schweitzer Classification
Other editions
Additional editions

James Moyne | Enrique del Castillo | Arnon M. Hurwitz
Run-to-Run Control in Semiconductor Manufacturing
E-Book
10/2018
CRC Press
€244.99
Available for download

James Moyne | Enrique del Castillo | Arnon M. Hurwitz
Run-to-Run Control in Semiconductor Manufacturing
E-Book
10/2018
1st Edition
CRC Press
€244.99
Available for download
Persons
James Moyne, Enrique del Castillo, Arnon M. Hurwitz
Content
Introduction. Background. Identifying Target Applications for Run-to-Run Control. Developing a Run-to-Run Solution: Run-to-Run Algorithms. Developing a Run-to-Run Solution: Practical Extensions to Algorithms. Developing and Deploying Run-to-Run Solutions: Integrating Control. Run-to-Run Control System Deployment Case Studies. Advanced Topics. Conclusions. References.