Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications
Published on 24. June 2014
Software
Other digital
344 pages
978-3-527-68107-5 (ISBN)
More details
Language
English
Place of publication
Weinheim
Germany
Target group
Professional and scholarly
Dimensions
Height: 150 mm
Width: 250 mm
Thickness: 15 mm
Weight
666 gr
ISBN-13
978-3-527-68107-5 (9783527681075)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Manuel Servin | J. Antonio Quiroga | Moises Padilla
Fringe Pattern Analysis for Optical Metrology
Theory, Algorithms, and Applications
E-Book
05/2014
1st Edition
Wiley-VCH
€133.99
Available for download
Manuel Servin | J. Antonio Quiroga | Moises Padilla
Fringe Pattern Analysis for Optical Metrology
Theory, Algorithms, and Applications
E-Book
05/2014
1st Edition
Wiley-VCH
€133.99
Available for download