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Your search for D. C. Joy

  1. Cover: SEM Microcharacterization of Semiconductors - Academic Press
    D. B. Holt | D. C. Joy
    SEM Microcharacterization of Semiconductors
    10/2013
    Academic Press
    9781483288673 (ISBN)
    E-Book
    PDF
    Other editions
    €54.95
    Available for download
  2. Cover: EXAFS Spectroscopy - Springer
    B. K. Teo | D. C. Joy
    EXAFS Spectroscopy
    Techniques and Applications
    10/2012
    Springer
    9781475712407 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €53.49
    Shipment within 15-20 days
  3. Cover: SEM Microcharacterization of Semiconductors: Volume 12 - Academic Press
    D. B. Holt | D. C. Joy
    SEM Microcharacterization of Semiconductors: Volume 12
    11/1989
    Academic Press
    9780123538550 (ISBN)
    Book
    Hardback
    Other editions
    €54.46
    Exhausted; check different version
  4. Cover: EXAFS Spectroscopy - Plenum Publishing Corporation
    B. K. Teo | D. C. Joy
    EXAFS Spectroscopy
    Techniques and Applications
    04/1981
    Plenum Publishing Corporation
    9780306406546 (ISBN)
    Book
    Hardback
    Other editions
    €85.59
    Exhausted; check different version
  5. This image is currently not available.
    Joseph I. Goldstein | Dale E. Newbury | Patrick Echlin
    Scanning Electron Microscopy and X-ray Microanalysis
    A Text for Biologists, Materials Scientists and Geologists
    06/1992
    2nd EDN2nd Edition
    Kluwer Academic / Plenum Publishers
    9780306441752 (ISBN)
    Book
    Hardback
    Other editions
    €109.13
    Exhausted; check different version
  6. This image is currently not available.
    A. G. Cullis | D. C. Joy
    Microscopy of Semiconducting Materials, 1981: Proceedings of the Royal Microscopical Society Conference Held in St. Catherine's College, Oxford, 6-10 April 1981
    11/1981
    Institute of Physics Publishing (GB)
    9780854981519 (ISBN)
    Book
    Hardback
    €143.51
    Article not available