Scanning Electron Microscopy and X-ray Microanalysis
A Text for Biologists, Materials Scientists and Geologists
2nd Edition
Published in June 1992
Book
Hardback
800 pages
978-0-306-44175-2 (ISBN)
More details
Edition
2nd Revised edition
Language
English
Place of publication
Dordrecht
Netherlands
Publishing group
Kluwer Academic Publishers Group
Target group
College/higher education
Professional and scholarly
Edition type
Revised edition
Illustrations
Illustrations
Dimensions
Height: 230 mm
ISBN-13
978-0-306-44175-2 (9780306441752)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Joseph Goldstein | Dale E. Newbury | Patrick Echlin
Scanning Electron Microscopy and X-Ray Microanalysis
A Text for Biologists, Materials Scientists, and Geologists
E-Book
12/2012
2nd Edition
Springer
€96.29
Available for download
Joseph Goldstein | Dale E. Newbury | Patrick Echlin
Scanning Electron Microscopy and X-Ray Microanalysis
A Text for Biologists, Materials Scientists, and Geologists
Book
09/2011
2nd Edition
Springer
€106.99
Shipment within 15-20 days