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Your search for Cher Ming Tan

  1. Cover: Reliability and Failure Analysis of High-Power LED Packaging - Woodhead Publishing
    Cher Ming Tan | Preetpal Singh
    Reliability and Failure Analysis of High-Power LED Packaging
    09/2022
    Woodhead Publishing
    9780128224076 (ISBN)
    E-Book
    ePUB
    Other editions
    €175.00
    Available for download
  2. Cover: Theory and Practice of Quality and Reliability Engineering in Asia Industry - Springer
    Cher Ming Tan | Thong Ngee Goh
    Theory and Practice of Quality and Reliability Engineering in Asia Industry
    01/2017
    Springer
    9789811032905 (ISBN)
    E-Book
    PDF
    Other editions
    €213.99
    Available for download
  3. Cover: Electromigration Modeling at Circuit Layout Level - Springer
    Cher Ming Tan | Feifei He
    Electromigration Modeling at Circuit Layout Level
    03/2013
    1st EDN1st Edition
    Springer
    9789814451215 (ISBN)
    E-Book
    PDF
    Other editions
    €53.49
    Available for download
  4. Cover: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections - Springer
    Cher Ming Tan | Wei Li | Zhenghao Gan
    Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
    03/2011
    1st EDN1st Edition
    Springer
    9780857293107 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  5. Cover: Reliability and Failure Analysis of High-Power LED Packaging - Woodhead Publishing
    Cher Ming Tan | Preetpal Singh
    Reliability and Failure Analysis of High-Power LED Packaging
    09/2022
    Woodhead Publishing
    9780128224083 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €191.50
    Shipment within 15-20 days
  6. Cover: Reliability Analysis of Electrotechnical Devices - MDPI AG
    Reliability Analysis of Electrotechnical Devices
    07/2022
    MDPI AG
    9783036546537 (ISBN)
    Book
    Hardback
    €73.30
    Shipment within 15-20 days
  7. Cover: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections - Springer
    Cher Ming Tan | Wei Li | Zhenghao Gan
    Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
    04/2013
    Springer
    9781447126416 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €106.99
    Shipment within 15-20 days
  8. Cover: Theory and Practice of Quality and Reliability Engineering in Asia Industry - Springer
    Cher Ming Tan | Thong Ngee Goh
    Theory and Practice of Quality and Reliability Engineering in Asia Industry
    01/2017
    Springer
    9789811032882 (ISBN)
    Book
    Hardback
    Other editions
    €213.99
    Shipment within 15-20 days
  9. Cover: Theory and Practice of Quality and Reliability Engineering in Asia Industry - Springer
    Cher Ming Tan | Thong Ngee Goh
    Theory and Practice of Quality and Reliability Engineering in Asia Industry
    07/2018
    Springer
    9789811098345 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €213.99
    Shipment within 15-20 days
  10. Cover: Electromigration Modeling at Circuit Layout Level - Springer
    Cher Ming Tan | Feifei He
    Electromigration Modeling at Circuit Layout Level
    05/2013
    Springer
    9789814451208 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €53.49
    Shipment within 15-20 days
  11. Cover: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections - Springer
    Cher Ming Tan | Wei Li | Zhenghao Gan
    Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
    03/2011
    1st EDN1st Edition
    Springer
    9780857293091 (ISBN)
    Book
    Hardback
    Other editions
    €106.99
    Shipment within 15-20 days
  12. Cover: Simulated Annealing - In Tech
    Cher Ming Tan
    Simulated Annealing
    09/2008
    In Tech
    9789537619077 (ISBN)
    Book
    Hardback
    €155.00
    Available (delivery time upon request)
  13. Cover: Electromigration In Ulsi Interconnections - World Scientific Publishing Co Pte Ltd
    Cher Ming Tan
    Electromigration In Ulsi Interconnections
    08/2010
    World Scientific Publishing Co Pte Ltd
    9789814273329 (ISBN)
    Book
    Hardback
    Other editions
    €102.10
    Shipment within 3-4 weeks