VLSI Electronics: Microstructure
Microstructure Science
Published on 10. July 2014
207 pages
978-1-4832-9658-6 (ISBN)
Description
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
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Additional editions
Anant G. Sabnis
VLSI Electronics: Microstructure: Volume 22
Book
05/1990
Academic Press
€54.55
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Content
Introduction. Reliability Concepts and Modeling. Electrostatic Discharge Damage. Metal Electromigration. Dielectric Breakdown. Instabilities in ICs. Packaging Related Reliability Issues. Reliability Assurance and Qualification. Each chapter includes references. Index.
