VLSI Electronics: Microstructure: Volume 22
Published on 18. May 1990
Book
Hardback
207 pages
978-0-12-234122-9 (ISBN)
Description
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Reviews / Votes
Dr. Sabnis has provided a broad overview of the major failure mechanisms afflicting modern semiconductor devices, and he has compiled a carefully selected list of references for each subject. He has also summarized many of the methods developed over time to evaluate reliability of these devices. I strongly recommend this book to all those*bMboth neophytes and experts*bMinvolved in the design, fabrication, and application of integrated circuits.--From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories
More details
Series
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
College/higher education
Professional and scholarly
Weight
450 gr
ISBN-13
978-0-12-234122-9 (9780122341229)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
E-Book
07/2014
Elsevier
€54.95
Available for download
Content
Introduction. Reliability Concepts and Modeling. Electrostatic Discharge Damage. Metal Electromigration. Dielectric Breakdown. Instabilities in ICs. Packaging Related Reliability Issues. Reliability Assurance and Qualification. Each chapter includes references. Index.