
The Image Processing Handbook
Description
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Incorporating image processing and analysis examples at all scales, from nano- to astro-, this Seventh Edition:
Features a greater range of computationally intensive algorithms than previous versions
Provides better organization, more quantitative results, and new material on recent developments
Includes completely rewritten chapters on 3D imaging and a thoroughly revamped chapter on statistical analysis
Contains more than 1700 references to theory, methods, and applications in a wide variety of disciplines
Presents 500+ entirely new figures and images, with more than two-thirds appearing in color
The Image Processing Handbook, Seventh Edition delivers an accessible and up-to-date treatment of image processing, offering broad coverage and comparison of algorithms, approaches, and outcomes.
Reviews / Votes
"With a new co-author (the same Brent Neal who has collaborated with him before in writing the excellent book Measuring Shape), John Russ has again produced a winner-a textbook and reference book that belongs on the shelf, and perhaps on the desk, of anyone involved in digital imaging. Even if you have a copy of one of the previous editions, this is a highly worthwhile addition."-Microscopy and Microanalysis, October 2016
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Persons
F. Brent Neal is a scientist and industrial researcher with Milliken Research Corporation, where he currently leads the central materials characterization and analytical chemistry facility. In this role, he leads efforts in technology and product development through deep understanding of materials performance. He has three patents issued or pending based on his work in polymer-matrix composites. Prior to his tenure at Milliken Research Corporation, he consulted and developed bespoke software for quantitative image analysis. He received his Ph.D in solid-state physics from Louisiana State University in 2002. Over the course of his career, he has measured and analyzed images from many different fields and his experience in materials characterization and measurement has been applied everywhere from the lab bench to manufacturing plants.
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