Cover: Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Springer

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon

Peter Pichler(Author)
Springer (Publisher)
Published on 6. December 2012
XXI, 554 pages
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978-3-7091-0597-9 (ISBN)
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