Efficient Test Methodologies for High-Speed Serial Links
1st Edition
Published on 24. December 2009
XII, 98 pages
978-90-481-3443-4 (ISBN)
Description
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
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Dongwoo Hong | Kwang-Ting Cheng
Efficient Test Methodologies for High-Speed Serial Links
Book
12/2009
Springer
€144.44
Shipment within 15-20 days
Content
An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.
