Efficient Test Methodologies for High-Speed Serial Links
Published on 7. December 2009
Book
Hardback
XII, 98 pages
978-90-481-3442-7 (ISBN)
Description
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
More details
Series
Edition
2010 ed.
Language
English
Place of publication
Dordrecht
Netherlands
Target group
Professional and scholarly
Research
Product notice
sewn/stitched
Cloth over boards
Illustrations
XII, 98 p.
Dimensions
Height: 244 mm
Width: 164 mm
Thickness: 18 mm
Weight
317 gr
ISBN-13
978-90-481-3442-7 (9789048134427)
DOI
10.1007/978-90-481-3443-4
Schweitzer Classification
Other editions
Additional editions
Dongwoo Hong | Kwang-Ting Cheng
Efficient Test Methodologies for High-Speed Serial Links
Book
03/2012
Springer
€144.44
Shipment within 15-20 days
Dongwoo Hong | Kwang-Ting Cheng
Efficient Test Methodologies for High-Speed Serial Links
E-Book
12/2009
1st Edition
Springer
€139.09
Available for download
Content
An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.