Electron Microscopy and Analysis
3rd Edition
Published on 30. November 2000
254 pages
978-1-4822-8934-3 (ISBN)
Description
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors h
More details
Edition
3rd edition
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
Professional and scholarly
File size
13,95 MB
ISBN-13
978-1-4822-8934-3 (9781482289343)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Peter J. Goodhew | John Humphreys | Richard Beanland
Electron Microscopy and Analysis
Book
07/2017
3rd Edition
CRC Press
€282.26
Shipment within 10-20 days
Peter J. Goodhew | John Humphreys | Richard Beanland
Electron Microscopy and Analysis
Book
11/2000
3rd Edition
Taylor & Francis
€117.10
Shipment within 15-20 days
Persons
Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.
Content
Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index
