
Electron Microscopy and Analysis
Taylor & Francis (Publisher)
3rd Edition
Published on 30. November 2000
Book
Paperback/Softback
264 pages
978-0-7484-0968-6 (ISBN)
Description
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
More details
Edition
3rd edition
Language
English
Place of publication
London
United Kingdom
Target group
College/higher education
Professional and scholarly
Illustrations
147 farbige Abbildungen
147 Illustrations, color
Dimensions
Height: 234 mm
Width: 156 mm
Thickness: 14 mm
Weight
406 gr
ISBN-13
978-0-7484-0968-6 (9780748409686)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Peter J. Goodhew | John Humphreys | Richard Beanland
Electron Microscopy and Analysis
Book
07/2017
3rd Edition
CRC Press
€282.26
Shipment within 10-20 days

Peter J. Goodhew | John Humphreys | Richard Beanland
Electron Microscopy and Analysis
E-Book
11/2000
3rd Edition
CRC Press
€111.99
Available for download

Peter J. Goodhew | John Humphreys | Richard Beanland
Electron Microscopy and Analysis
E-Book
11/2000
3rd Edition
CRC Press
€111.99
Available for download
Persons
Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.
Author
University of Liverpool, England, UK
The University of Manchester, England, UK
GEC-Marconi Materials Technology, England, UK
Content
Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index