VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Published on 13. December 2013
XVI, 388 pages
978-3-642-42024-5 (ISBN)
Description
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
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Manoj Singh Gaur | Mark Zwolinski | Vijay Laxmi
VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Book
12/2013
Springer
€53.49
Shipment within 7-9 days
Content
VLSI design.- Testing and verification.- Embedded systems.- Emerging technology.
