VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Published on 10. December 2013
Book
Paperback/Softback
XVI, 388 pages
978-3-642-42023-8 (ISBN)
Description
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
More details
Series
Edition
2013 ed.
Language
English
Place of publication
Berlin
Germany
Publishing group
Springer Berlin
Target group
Professional and scholarly
Research
Illustrations
246 s/w Abbildungen
XVI, 388 p. 246 illus.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 22 mm
Weight
610 gr
ISBN-13
978-3-642-42023-8 (9783642420238)
DOI
10.1007/978-3-642-42024-5
Schweitzer Classification
Other editions
Additional editions
Manoj Singh Gaur | Mark Zwolinski | Vijay Laxmi
VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
E-Book
12/2013
Springer
€53.49
Available for download
Content
VLSI design.- Testing and verification.- Embedded systems.- Emerging technology.