
Tolerance Analysis of Electronic Circuits Using MATHCAD
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worst-case analysis,
limits for production testing,
component stress analysis,
determining if a design meets specification limits, and
manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
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