Tolerance Analysis of Electronic Circuits Using MATHCAD
1st Edition
Published on 24. September 1999
Book
Paperback/Softback
214 pages
978-0-8493-2339-3 (ISBN)
Description
Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCADae offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:
worst-case analysis,
limits for production testing,
component stress analysis,
determining if a design meets specification limits, and
manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
worst-case analysis,
limits for production testing,
component stress analysis,
determining if a design meets specification limits, and
manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
More details
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
Professional and scholarly
Academic, Professional, and Professional Practice & Development
Dimensions
Height: 198 mm
Width: 129 mm
Weight
400 gr
ISBN-13
978-0-8493-2339-3 (9780849323393)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
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Content
MATHCADRoot Sum Square and Extreme Value AnalysisMATHCAD DerivativesApproximate DerivativesExtreme Value Analysis (EVA)Root Sum Square (RSS) AnalysisDC Differential AmplifierAsymmetric TolerancesGeneral RSS/EVA Equation SequenceCompare MATHCAD EVA with SpiceCompare Circuit Analysis MethodsMore Compicated CircuitsRTD A MatrixMATHCAD EVA/RSS Analysis of RTD CircuitTolerance Analysis of a Bandpass FilterSpice AnalysisBandpass Filter with Asymmetric TolerancesLow Pass FilterMonte Carlo AnalysisRandom Number GeneratorMATHCAD's Random Number GeneratorGaussian Random Number Generator (RNG)Converting to Random TolerancesMonte Carlo Analysis-DC Differential AmplifierMCA of RTD CircuitMCA Bandpass Filter (BPF)Fast Monte Carlo Analysis-FMCAFMCA-Bandpass FilterMCA of BPFComponent SlopesSallen & Key BPFSallen & Key BPF-FMCA & EVAMCA-Sallen & Key BPFWhy the MCA Spikes OccurEstimating Manufacturing YieldBPF Yield AnalysisAdvanced TopicsDifferential AmplifierEVA/RSS of Opamp OffsetsMCA of Opamp OffsetsComparing Normal and Uniform DistributionsMCA of Opamo Offsets (continued)Tolerance Analysis of LM158 Opamp Stability/Phase MarginTolerance Analysis of an A-to-D CircuitDecimal to 8-Bit Binary ConversionNS MF10 Switched Capacitor Filter-Mode 3, BPF400Hz Full-Wave Rectifier CircuitConfidence Intervals for 3s RSSConfidence Intervals for the MeanLarge CircuitComparator Circuit100Hz Clock GeneratorIterative Transient AnalysisHalf-Wave Rectifier Transient AnalysisSecond Order Transient AnalysisTransient MCA of Bridged-T CircuitPulse Transformer-Frequency ResponsePusle Transformer-Transient ResponseSpice ListingAppendixDerivation of the RSS EquationDerivation of Factor for Uniform Distribution InputsAsymmetric Gaussian DistributionRatio Algori