Runs and Scans with Applications
Published on 20. September 2011
488 pages
978-1-118-15045-0 (ISBN)
Description
Expert practical and theoretical coverage of runs and scans
This volume presents both theoretical and applied aspects of runsand scans, and illustrates their important role in reliabilityanalysis through various applications from science and engineering.Runs and Scans with Applications presents new and exciting contentin a systematic and cohesive way in a single comprehensive volume,complete with relevant approximations and explanations of somelimit theorems.
The authors provide detailed discussions of both classical andcurrent problems, such as:
* Sooner and later waiting time
* Consecutive systems
* Start-up demonstration testing in life-testing experiments
* Learning and memory models
* "Match" in genetic codes
Runs and Scans with Applications offers broad coverage of thesubject in the context of reliability and life-testing settings andserves as an authoritative reference for students and professionalsalike.
Reviews / Votes
"...many excellent features..." (StatisticalMethods in Medical Research, No.13, 2004) "...provides excellent coverage of the topic of scans, and runs,including a nice historical account and guide to the literature..."(Technometrics, Vol. 44, No. 4, November 2002) "...highly recommended...well done and perfectly edited..."(Journal of the American Statistical Association, December2002) "...a great resource..." (International Journal of GeneralSystems, Vol. 32, 2003)More details
Other editions
Additional editions
N. Balakrishnan
Runs and Scans with Applications
Software
10/2011
Wiley
€229.97
Shipment within 15-20 days
N. Balakrishnan | Markos V. Koutras
Runs and Scans with Applications
Book
12/2001
Wiley
€199.50
Shipment within 10-20 days
Persons
N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics atMcMaster University in Hamilton, Ontario, Canada. He is also theauthor of A First Course in Order Statistics and four volumes ofthe Distributions in Statistics series (all from Wiley).
MARKOS V. KOUTRAS, PhD, is Professor of Statistics at theUniversity of Piraeus in Greece, where he researches appliedprobability, reliability, and distribution theory.
Content
List of Tables.
List of Figures.
Preface.
Introduction and Historical Remarks.
Waiting for the First Run Occurrence.
Applications.
Waiting for Multiple Run Occurrences.
Number of Run Occurrences.
Sooner/Later Run Occurrences.
Multivariate Run-Related Distributions.
Applications.
Waiting for the First Scan.
Waiting for Multiple Scans.
Number of Scan Occurrences.
Applications.
Bibliography.
Author Index.
Subject Index.
