
Runs and Scans with Applications
Wiley (Publisher)
Published on 5. December 2001
Book
Hardback
488 pages
978-0-471-24892-7 (ISBN)
Description
Expert practical and theoretical coverage of runs and scans
This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems.
The authors provide detailed discussions of both classical and current problems, such as:
* Sooner and later waiting time
* Consecutive systems
* Start-up demonstration testing in life-testing experiments
* Learning and memory models
* "Match" in genetic codes
Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.
Reviews / Votes
"...many excellent features..." (Statistical Methods in Medical Research, No.13, 2004) "...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature..." (Technometrics, Vol. 44, No. 4, November 2002) "...highly recommended...well done and perfectly edited..." (Journal of the American Statistical Association, December 2002) "...a great resource..." (International Journal of General Systems, Vol. 32, 2003)More details
Product info
gebunden
Series
Edition
1. Auflage
Language
English
Place of publication
New York
United States
Target group
College/higher education
Professional and scholarly
Product notice
sewn/stitched
Cloth over boards
Illustrations
Tables: 17 B&W, 0 Color; Graphs: 42 B&W, 0 Color
Dimensions
Height: 240 mm
Width: 161 mm
Thickness: 30 mm
Weight
886 gr
ISBN-13
978-0-471-24892-7 (9780471248927)
Schweitzer Classification
Other editions
Additional editions

N. Balakrishnan | Markos V. Koutras
Runs and Scans with Applications
E-Book
09/2011
Wiley
€174.99
Available for download
Persons
N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada. He is also the author of A First Course in Order Statistics and four volumes of the Distributions in Statistics series (all from Wiley).
MARKOS V. KOUTRAS, PhD, is Professor of Statistics at the University of Piraeus in Greece, where he researches applied probability, reliability, and distribution theory.
Content
List of Tables.
List of Figures.
Preface.
Introduction and Historical Remarks.
Waiting for the First Run Occurrence.
Applications.
Waiting for Multiple Run Occurrences.
Number of Run Occurrences.
Sooner/Later Run Occurrences.
Multivariate Run-Related Distributions.
Applications.
Waiting for the First Scan.
Waiting for Multiple Scans.
Number of Scan Occurrences.
Applications.
Bibliography.
Author Index.
Subject Index.