Scanning Tunneling Microscopy
Published on 28. November 1997
Book
Hardback
380 pages
978-0-12-475972-5 (ISBN)
Description
In little more than a decade, the scanning tunneling microscope (STM) has revolutionized surface science and related fields. This introduction covers the theory, design and applications of scanning tunneling microscopy and should be of interest to researchers and graduate students in the physical sciences and engineering, especially surface scientists.
More details
Series
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
College/higher education
Professional and scholarly
Illustrations
references, index
Dimensions
Height: 235 mm
Width: 157 mm
Weight
822 gr
ISBN-13
978-0-12-475972-5 (9780124759725)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
E-Book
05/2014
Academic Press
€54.95
Available for download
Content
Part 1: theory of scanning tunneling microscopy, J. Tersoff and N.D. Lang; design considerations for an STM system, S.I. Park and R.C. Barrett; extensions of STM, H.K. Wickramasinghe; tunneling spectroscopy, J.A. Stroscio and R.M. Feenstra. Part 2 Semiconductor surfaces: silicon, R. Becker and R. Wolkow; germanium, R. Becker; gallium arsenide, R.M. Feenstra and J.A. Stroscio; metal surfaces, Y. Kuk; ballistic electron emission microscopy, L.D. Bell, et al; charge-density waves, R.V. Coleman, et al; superconductors, H.F. Hess.