Scanning Tunneling Microscopy
Volume 27
Published on 14. May 2014
481 pages
978-0-08-086015-2 (ISBN)
Description
Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
More details
Series
Language
English
Place of publication
San Diego
United States
Product notice
Windows
ISBN-13
978-0-08-086015-2 (9780080860152)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Joseph A. Stroscio | William J. Kaiser
Scanning Tunneling Microscopy
Book
11/1997
Academic Press
€105.23
Article exhausted; check different version
Persons
Content
J. Tersoff and N.D. Lang, Theory of Scanning Tunneling Microscopy. S.-I. Park and R.C. Barrett, Design Considerations for an STM System. H.K. Wickramasinghe, Extensions of STM. J.A. Stroscio and R.M.Feenstra, Tunneling Spectroscopy. R. Becker and R. Wolkow, Semiconductor Surfaces. Y. Kuk, Metal Surfaces. L.D. Bell, W.J. Kaiser, M.H. Hecht, and L.C. Davis, Ballistic Electron Emission Microscopy. R.V. Coleman, Z. Dai, W.W.McNairy, C.G. Slough, and C. Wang, Charge-Density Waves. H.F. Hess, Superconductors. Chapter References. Subject Index.
