Soft Errors in Modern Electronic Systems
Published on 5. November 2012
Book
Paperback/Softback
XVIII, 318 pages
978-1-4614-2689-9 (ISBN)
Description
Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics
More details
Series
Edition
2011 ed.
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Professional/practitioner
Illustrations
XVIII, 318 p.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 19 mm
Weight
511 gr
ISBN-13
978-1-4614-2689-9 (9781461426899)
DOI
10.1007/978-1-4419-6993-4
Schweitzer Classification
Other editions
Additional editions
Michael Nicolaidis
Soft Errors in Modern Electronic Systems
Book
09/2010
Springer
€171.19
Shipment within 15-20 days
Content
Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends.- Radiation Induced Single-Event Effects: Physical Mechanisms and Classification.- JEDEC Standard on Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors.- Cell-Level Modelling and Simulation.- Circuit and System Level Modelling and Simulation.- Hardware Fault Injection.- Accelerated Radiation Testing for Space Applications.- Testing for Ground-Level Applications.- Soft Error Mitigation Techniques.- Convergence of Mitigation Techniques for Soft Errors and Other Reliability Issues and Power Aware Mitigation Techniques.- Software Level Soft-Error Mitigation Techniques.- System Level Soft-Error Mitigation Techniques.