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Your search for Frontiers in Electronic Testing

  1. Cover: On-Line Testing for VLSI - Springer
    Michael Nicolaidis | Yervant Zorian | Dhiraj Pradhan
    On-Line Testing for VLSI
    03/2013
    Springer
    9781475760699 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  2. Cover: Analog and Mixed-Signal Boundary-Scan - Springer
    Adam Osseiran
    Analog and Mixed-Signal Boundary-Scan
    A Guide to the IEEE 1149.4 Test Standard
    03/2013
    Springer
    9781475744996 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
  3. Cover: Testability Concepts for Digital ICs - Springer
    F.P.M. Beenker | R.G. Bennetts | A.P. Thijssen
    Testability Concepts for Digital ICs
    The Macro Test Approach
    12/2012
    Springer
    9781461523659 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
  4. Cover: Introduction to IDDQ Testing - Springer
    S. Chakravarty | Paul J. Thadikaran
    Introduction to IDDQ Testing
    12/2012
    Springer
    9781461561378 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  5. Cover: From Contamination to Defects, Faults and Yield Loss - Springer
    Jitendra B. Khare | Wojciech Maly
    From Contamination to Defects, Faults and Yield Loss
    Simulation and Applications
    12/2012
    Springer
    9781461313779 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  6. Cover: Efficient Branch and Bound Search with Application to Computer-Aided Design - Springer
    Xinghao Chen | Michael L. Bushnell
    Efficient Branch and Bound Search with Application to Computer-Aided Design
    12/2012
    Springer
    9781461313298 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  7. Cover: Multi-Chip Module Test Strategies - Springer
    Yervant Zorian
    Multi-Chip Module Test Strategies
    12/2012
    Springer
    9781461561071 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  8. Cover: Reasoning in Boolean Networks - Springer
    Wolfgang Kunz | Dominik Stoffel
    Reasoning in Boolean Networks
    Logic Synthesis and Verification Using Testing Techniques
    03/2013
    Springer
    9781475725728 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
  9. Cover: Testing Static Random Access Memories - Springer
    Said Hamdioui
    Testing Static Random Access Memories
    Defects, Fault Models and Test Patterns
    06/2013
    Springer
    9781475767063 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  10. Cover: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Springer
    Krishnendu Chakrabarty
    SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
    04/2013
    Springer
    9781475765274 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  11. Cover: Embedded Processor-Based Self-Test - Springer
    Dimitris Gizopoulos | A. Paschalis | Yervant Zorian
    Embedded Processor-Based Self-Test
    03/2013
    Springer
    9781402028014 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
  12. Cover: Defect Oriented Testing for CMOS Analog and Digital Circuits - Springer
    Manoj Sachdev
    Defect Oriented Testing for CMOS Analog and Digital Circuits
    06/2013
    Springer
    9781475749267 (ISBN)
    E-Book
    PDF
    Other editions
    €85.59
    Available for download
  13. Cover: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Springer
    Andrei Pavlov | Manoj Sachdev
    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    Process-Aware SRAM Design and Test
    06/2008
    1st EDN1st Edition
    Springer
    9781402083631 (ISBN)
    E-Book
    PDF
    Other editions
    €160.49
    Available for download
  14. Cover: Oscillation-Based Test in Mixed-Signal Circuits - Springer
    Gloria Huertas Sánchez | Diego Vázquez García de la Vega | Adoración Rueda Rueda
    Oscillation-Based Test in Mixed-Signal Circuits
    06/2007
    1st EDN1st Edition
    Springer
    9781402053153 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
  15. Cover: Models in Hardware Testing - Springer
    Hans-Joachim Wunderlich
    Models in Hardware Testing
    Lecture Notes of the Forum in Honor of Christian Landrault
    11/2009
    1st EDN1st Edition
    Springer
    9789048132829 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  16. Cover: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Springer
    Manoj Sachdev | José Pineda de Gyvez
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    06/2007
    2nd EDN2nd Edition
    Springer
    9780387465470 (ISBN)
    E-Book
    PDF
    Other editions
    €213.99
    Available for download
  17. Cover: Emerging Nanotechnologies - Springer
    Mohammad Tehranipoor
    Emerging Nanotechnologies
    Test, Defect Tolerance, and Reliability
    12/2007
    1st EDN1st Edition
    Springer
    9780387747477 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
  18. Cover: Digital Timing Measurements - Springer
    Wolfgang Maichen
    Digital Timing Measurements
    From Scopes and Probes to Timing and Jitter
    10/2006
    1st EDN1st Edition
    Springer
    9780387314198 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
  19. Cover: Data Mining and Diagnosing IC Fails - Springer
    Leendert M. Huisman
    Data Mining and Diagnosing IC Fails
    10/2006
    1st EDN1st Edition
    Springer
    9780387263519 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  20. Cover: Advances in Electronic Testing - Springer
    Dimitris Gizopoulos
    Advances in Electronic Testing
    Challenges and Methodologies
    01/2006
    1st EDN1st Edition
    Springer
    9780387294094 (ISBN)
    E-Book
    PDF
    Other editions
    €149.79
    Available for download
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