Surface Characterization
A User's Sourcebook
Published on 11. November 1997
Book
Hardback
XIII, 702 pages
978-3-527-28843-4 (ISBN)
Description
D. Brune, R. Hellborg H.J. Whitlow, O. Hunderi Surface Characterization Surface Characterization provides an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of materials. Practical in approach, it not only describes the major analytical techniques but emphasizes how they can be used to solve a multitude of chemical and physical problems. A special feature of the book is that the various techniques are grouped according to the material property under investigation. These parts are preceded by an overview comparing the capabilities of the characterization methods available. Extensive data tables allow the reader to assess rapidly the strengths as well as the pitfalls inherent in each method. Chapters on chemical composition, optical and crystallographic properties, microtopography, surface processes, tribology, electrical and magnetic properties of surface films are featured. In addition, chapters specializing on applications within the life sciences on the microscopic scale and chemometrics are included.
Reviews / Votes
This new book is providing an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of the materials. It can be used as a reference guide for scientists and engineers from a broad range of disciplines within the metallurgy as well as materials technologies. - Aluminium.More details
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Additional editions
E-Book
07/2008
1st Edition
Wiley-VCH
€205.99
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Content
MICROSTRUCTURE AND TOPOGRAPHY. Optical Microscopy (E. Suoninen). Confocal Scanning Optical Microscopy (N. McCormick). Scanning Probe Microscopy (L. Mattsson). Surface Roughness and Microtopography (L. Mattsson). Etching for Microscopy (P. Zagierski). ELEMENTAL COMPOSITION. Scanning Electron Microscope with Energy- and Wavelength-Dispersive Spectrometry (K. Kristiansen). X-Ray Fluorescence Analysis (Myint U, et al.). Energy-Dispersive X-Ray Fluorescence Analysis (R. Pettersson & E. Selin-Lindgren). Particle-Induced X-Ray Emission and Particle-Induce Gramma Ray Emission (K. Malmqvist). Charged-Particle Activation Analysis (K. Strijckmans). Atom-Probe Field-Ion Microscopy (H-O. Andr?n). Ion Scattering Spectroscopy (E. Taglauer). Dynamic-Mode Secondary-Ion Mass Spectrometry (A. Lodding & U. S?dervall). Glow-Discharge Optical-Emission Spectroscopy (A. Bergston). Nuclear Reaction Analysis (H. Whitlow & R. Hellborg). Rutherford Back-Scattering Spectrometry and Recoil Spectrometry (H. Whitlow & M. ?stling). Auger Electron Spectroscopy (C.-O. Alsson, et al.). CHEMICAL BONDING AND MOLECULAR COMPOSITION. X-Ray Photoelectron Spectroscopy (I. Olefjord). Synchrotron Light (I. Lindau). Static Mode Secondary-Ion Mass Spectrometry (P. Berstrand & L. Weng). Laser-Microprobe Mass Spectrometry (L. van Vaeck, et al.). Fourier-Transform Infrared Spectroscopy (J. Leppinen). Raman Spectroscopy (E. Samuelsen). M?ssbauer Spectroscopy (R. W?ppling). Laminate Analysis by Chemometrics (A. Christy, et al.). CRYSTALLOGRAPHY AND STRUCTURE. Studies of Surface Structures by X-Ray Diffraction and Reflectometry (E. Samuelsen). Transmission Electron Microscopy and Diffraction (E. Johnson). Electrons for Surface Diffraction, Imaging and Vibrational Spectroscopy (C. Nyberg). Channelling (R. Hellborg). SURFACE FILMS. Optical Characterization of Surfaces by Linear Spectroscopy (J. Bremer, et al.). Optical Second-Harmonic and Sum-Frequency Generation (J. McGilp). Electrical and Magnetic Properties of Thin Films (S. Hellstr?m). Measurement and Properties of Thin Films (S. Hellstr?m). SURFACE REACTIONS. Adhesion and Surface Energy (R. Larsson). Surface Reactivity (R. Larsson). Emanation Thermal Analysis (J. T?lgyessy & R. Larsson). Electrochemical Methods (J. Berendson). Corrosion Measurements by Use of Thin-layer Activation (J. Asher). Nuclear-Based Corrosion Monitoring (D. Brune). TRIBOLOGY. Tribosurface Properties (S. Hogmark, et al.). Wear Measurements Using Thin-Layer Activation (J. Asher). LIFE SCIENCES. Biomaterials (B. Kasemo & J. Lausmaa). Biological Nuclear Microscopy (U. Lindh). Index.