Advances in X-Ray Analysis
Volume 35B
Published on 21. November 2012
Book
Paperback/Softback
IV, 641 pages
978-1-4613-6532-7 (ISBN)
Description
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
More details
Edition
Softcover reprint of the original 1st ed. 1992
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Illustrations
IV, 641 p.
Dimensions
Height: 244 mm
Width: 170 mm
Thickness: 35 mm
Weight
1100 gr
ISBN-13
978-1-4613-6532-7 (9781461365327)
DOI
10.1007/978-1-4615-3460-0
Schweitzer Classification
Other editions
Additional editions
Book
10/1992
1st Edition
Kluwer Academic/Plenum Publishers
€96.00
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Content
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.