Advances in X-Ray Analysis
Volume 35B
1st Edition
Published on 31. October 1992
Book
Hardback
IV, 640 pages
978-0-306-44249-0 (ISBN)
Description
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
More details
Edition
1., 992
Language
English
Place of publication
Boston, MA
United States
Publishing group
Springer Science+Business Media
Target group
College/higher education
Professional and scholarly
Research
Product notice
sewn/stitched
Cloth over boards
Illustrations
IV, 640 p.
65 black & white illustrations
Dimensions
Height: 250 mm
Width: 175 mm
Thickness: 41 mm
Weight
1282 gr
ISBN-13
978-0-306-44249-0 (9780306442490)
DOI
10.1007/978-1-4615-3460-0
Schweitzer Classification
Other editions
Additional editions
Book
11/2012
Springer
€53.49
Shipment within 7-9 days
Content
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.