Means and Methods for Measurement and Monitoring

Supplement Book to Advanced Micro-Device Engineering VIII
 
 
Trans Tech Publications (Verlag)
  • erschienen am 6. März 2019
 
  • Software
  • |
  • CD-ROM
  • |
  • 108 Seiten
978-3-0357-2553-7 (ISBN)
 
This special issue is the supplement book to proceedings of the 8th International Conference on Advanced Micro-Device Engineering (AMDE 2016) organized by the Human Resource Cultivation Center, Gunma University, held on 9 December 2016 in Kiryu, Japan. Thematic area of this volume is "Measurement and System technology"
  • Englisch
  • Schweiz
978-3-0357-2553-7 (9783035725537)
10.4028/www.scientific.net/AMM.888
weitere Ausgaben werden ermittelt
Ed. Osamu Hanaizumi
Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability CriterionEffect of Phase Error in Phase-Shifting InterferometerComparator Synthesis Using Distributed Genetic Algorithm and HSPICE OptimizationRC Polyphase Filter as Complex Analog Hilbert FilterRehabilitation Assistance Using Motion Capture Devices and Virtual Reality FeedbackNoise Filter for Surface Shape Measurement in Digital HolographyDetermination of Phase Shift by Digital HolographyHigh-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima PrecodingA Torque-Sensorless Viscometer for Food Processing ApplicationsEffect of Mass Added to a Force Transducer on the Dynamic-Force Correction MethodAnother Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray SourceA Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOS

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