Advanced Device Characterization & Test Methodologies (IEDM 1994)
Institute of Electrical & Electronics Engineers(IEEE) (Publisher)
Published on 1. October 1999
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978-0-7803-2369-8 (ISBN)
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Language
English
Duration
Dauer: 364 min
ISBN-13
978-0-7803-2369-8 (9780780323698)
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