Reflection, Scattering, and Diffraction from Surfaces II
2-4 August 2010, San Diego, California, United States
Zu-Han Gu(Author)
SPIE Press
Published on 1. January 2010
Other
Microfilm
360 pages
978-0-8194-8288-4 (ISBN)
More details
Language
English
Place of publication
Bellingham
United States
Illustrations
illustrations
Dimensions
Height: 229 mm
Width: 152 mm
ISBN-13
978-0-8194-8288-4 (9780819482884)
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Schweitzer Classification