Advances in X-Ray/EUV Optics and Components V
2-3 August 2010, San Diego, California, United States
Published on 1. January 2010
Other
Microfilm
200 pages
978-0-8194-8298-3 (ISBN)
More details
Language
English
Place of publication
Bellingham
United States
Target group
College/higher education
Professional and scholarly
Illustrations
illustrations
Dimensions
Height: 229 mm
Width: 152 mm
ISBN-13
978-0-8194-8298-3 (9780819482983)
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Schweitzer Classification