Reliability, Packaging, Testing, and Characterization of Mems/Moems and Nanodevices X
24-25 January 2011, San Francisco, California, United States
Published on 1. January 2011
Other
Microfilm
256 pages
978-0-8194-8465-9 (ISBN)
More details
Edition
New ed.
Language
English
Place of publication
Bellingham
United States
Target group
Professional and scholarly
Illustrations
illustrations
Dimensions
Height: 229 mm
Width: 152 mm
ISBN-13
978-0-8194-8465-9 (9780819484659)
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Schweitzer Classification