X-Ray Spectrometry - Recent Technological Advances
Published on 9. June 2004
Software
Other digital
616 pages
978-0-470-02043-2 (ISBN)
Description
X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. * Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays* Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends* Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields* Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.
More details
Language
English
Place of publication
Chichester
United Kingdom
Publishing group
John Wiley and Sons Ltd
Target group
Professional and scholarly
Dimensions
Height: 252 mm
Width: 197 mm
Thickness: 39 mm
Weight
1462 gr
ISBN-13
978-0-470-02043-2 (9780470020432)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
E-Book
08/2005
Wiley
€432.99
Available for download
Persons
Content
Contributors. Preface. 1 Introduction. 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume. 2 X-Ray Sources. 2.1 Micro X-ray Sources. 2.2 New Synchrotron Radiation Sources. 2.3 Laser-driven X-ray Sources. 3 X-Ray Optics. 3.1 Multilayers for Soft and Hard X-rays. 3.2 Single Capillaries X-ray Optics. 3.3 Polycapillary X-ray Optics. 3.4 Parabolic Compound Refractive X-ray Lenses. 4 X-Ray Detectors. 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy. 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry. 4.3 Superconducting Tunnel Junctions. 4.4 Cryogenic Microcalorimeters. 4.5 Position Sensitive Semiconductor Strip Detectors. 5 Special Configurations. 5.1 Grazing-incidence X-ray Spectrometry. 5.2 Grazing-exit X-ray Spectrometry. 5.3 Portable Equipment for X-ray Fluorescence Analysis. 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis. 5.5 High-energy X-ray Fluorescence. 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy. 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy. 5.8 X-Ray Absorption Techniques. 6 New Computerisation Methods. 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy. 6.2 Spectrum Evaluation. 7 New Applications. 7.1 X-Ray Fluorescence Analysis in Medical Sciences. 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films. 7.3 X-Ray Spectrometry in Archaeometry. 7.4 X-Ray Spectrometry in Forensic Research. 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry. Index.