Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
Published on 16. April 2018
Software
Other digital
296 pages
978-1-118-69654-5 (ISBN)
More details
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Dimensions
Height: 250 mm
Width: 150 mm
Thickness: 15 mm
Weight
666 gr
ISBN-13
978-1-118-69654-5 (9781118696545)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Budhika G. Mendis
Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
E-Book
03/2018
1st Edition
Wiley
€109.99
Available for download
Budhika G. Mendis
Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
E-Book
03/2018
1st Edition
Wiley
€109.99
Available for download