Microstructural Investigation and Analysis
Wiley-VCH (Publisher)
Published on 9. May 2006
Software
Other digital
338 pages
978-3-527-60616-0 (ISBN)
Description
Modern understanding of materials include the approach at the microscopic or nanometric level. In the best case, imaging at the atomic level is possible. These approaches are essential for instance in the exploration of interfaces, surfaces and defects in crystals. Several aspects can be explored, the microstructure, local element composition, and chemical bonds. This book presents the state-of-the-art of modern investigation methods of materials.
More details
Series
Language
English
Place of publication
Weinheim
Germany
Target group
Professional and scholarly
Weight
10 gr
ISBN-13
978-3-527-60616-0 (9783527606160)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Content
Scanning and Transmission Electron Microscopy Convergent Beam Electron Diffraction X-Ray Characterization EELS X-Ray Synchrotron Radiation (EXAFS, XANES) SIMS Auger Microscopy PIXE Near Field Microscopy