
Transmission Electron Microscopy in Micro-nanoelectronics
A. Claverie(Author)
Wiley (Publisher)
Published on 25. January 2013
Software
Other digital
264 pages
978-1-118-57902-2 (ISBN)
More details
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Dimensions
Height: 233 mm
Width: 188 mm
Thickness: 54 mm
Weight
1442 gr
ISBN-13
978-1-118-57902-2 (9781118579022)
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Schweitzer Classification