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Your search for Research at NaMLab

  1. Cover: Herstellung ultra-dünner hoch- varepsilon?r Oxide und deren Verhalten unter dynamischen elektrischen Stressbedingungen - Logos Berlin
    Steve Knebel
    Herstellung ultra-dünner hoch- varepsilon?r Oxide und deren Verhalten unter dynamischen elektrischen Stressbedingungen
    10/2019
    Logos Berlin
    9783832549947 (ISBN)
    Book
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    €49.50
    Shipment within 7-9 days
  2. Cover: Development of HfO2-Based Ferroelectric Memories for Future CMOS Technology Nodes - Research at NaMLab
    Stefan Ferdinand Müller
    Development of HfO2-Based Ferroelectric Memories for Future CMOS Technology Nodes
    10/2022
    1st EDN1st Edition
    Research at NaMLab
    9783741219924 (ISBN)
    E-Book
    PDF
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    €39.99
    Available for download
  3. Cover: Electrical Characterisation of Ferroelectric Field Effect Transistors based on Ferroelectric HfO² Thin Films - Logos Berlin
    Ekaterina Yurchuk
    Electrical Characterisation of Ferroelectric Field Effect Transistors based on Ferroelectric HfO² Thin Films
    06/2015
    Logos Berlin
    9783832540036 (ISBN)
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    €40.50
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  4. Cover: Development of HfO2-Based Ferroelectric Memories for Future CMOS Technology Nodes - BoD - Books on Demand
    Stefan Ferdinand Müller
    Development of HfO2-Based Ferroelectric Memories for Future CMOS Technology Nodes
    04/2016
    1st EDN1st Edition
    BoD - Books on Demand
    9783739248943 (ISBN)
    Book
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    €49.99
    Shipment within 7-9 days
  5. Cover: Scanning Spreading Resistance Microscopy and its Application to Passive and Active Semiconductor Device Characterization - Logos Berlin
    Stefan Döring
    Scanning Spreading Resistance Microscopy and its Application to Passive and Active Semiconductor Device Characterization
    03/2017
    Logos Berlin
    9783832544508 (ISBN)
    Book
    Paperback/Softback
    €51.00
    No shipping information available
  6. Cover: Modellierung und Charakterisierung des elektrischen Verhaltens von haftstellen-basierten Flash-Speicherzellen - Logos Berlin
    Thomas Melde
    Modellierung und Charakterisierung des elektrischen Verhaltens von haftstellen-basierten Flash-Speicherzellen
    03/2011
    Logos Berlin
    9783832527488 (ISBN)
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    €41.50
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  7. Cover: Leakage Current and Defect Characterization of Short Channel MOSFETs - Logos Berlin
    Guntrade Roll
    Leakage Current and Defect Characterization of Short Channel MOSFETs
    11/2012
    Logos Berlin
    9783832532611 (ISBN)
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    €49.50
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  8. Cover: Ultrathin Calcium Titanate Capacitors - Logos Berlin
    Andreas Krause
    Ultrathin Calcium Titanate Capacitors
    Physics and Application
    07/2014
    Logos Berlin
    9783832537241 (ISBN)
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    €35.00
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