2 results
Classification (2)
Year
Persons
Publishers
Sort by
Results per page
Filter
2 results

Your search for W. Murray Bullis

  1. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Thomas J. Shaffner
    Characterization and Metrology for ULSI Technology 2000
    International Conference
    04/2001
    1st EDN1st Edition
    American Institute of Physics
    9781563969676 (ISBN)
    Book
    Mixed media product
    €245.03
    No shipping information available
  2. This image is currently not available.
    W. Murray Bullis | Alain C. Diebold | David G. Seiler
    Semiconductor Characterization
    Present Status and Future Need
    11/1995
    American Institute of Physics
    9781563965036 (ISBN)
    Book
    Hardback
    €71.19
    Exhausted; no reprint