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Your search for Stefan Zollner

  1. Cover: Progress in Semiconductors II - Electronic and Optoelectronic Applications: Volume 744 - Materials Research Society
    B. D. Weaver | M. Omar Manasreh | C. C. Jagadish
    Progress in Semiconductors II - Electronic and Optoelectronic Applications: Volume 744
    04/2003
    Materials Research Society
    9781558996816 (ISBN)
    Book
    Hardback
    €48.46
    Exhausted, reprint undefined
  2. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Characterization and Metrology for ULSI Technology 2005
    11/2005
    1st EDN1st Edition
    American Institute of Physics
    9780735402775 (ISBN)
    Book
    Mixed media product
    €327.42
    No shipping information available
  3. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Thomas J. Shaffner
    Characterization and Metrology for ULSI Technology: 2003
    2003 International Conference on Characterization and Metrology for ULSI Technology
    11/2003
    1st EDN1st Edition
    American Institute of Physics
    9780735401525 (ISBN)
    Book
    Hardback
    €176.50
    No shipping information available