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Your search for R. Shimizu

  1. Cover: Secondary Ion Mass Spectrometry SIMS IV - Springer
    A. Benninghoven | J. Okano | R. Shimizu
    Secondary Ion Mass Spectrometry SIMS IV
    Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
    12/2012
    Springer
    9783642822568 (ISBN)
    E-Book
    PDF
    Other editions
    €96.29
    Available for download
  2. Cover: Secondary Ion Mass Spectrometry SIMS II - Springer
    A. Benninghoven | C.A. Jr. Evans | R.A. Powell
    Secondary Ion Mass Spectrometry SIMS II
    Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979
    12/2011
    Springer
    9783642618734 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €106.99
    Shipment within 7-9 days
  3. Cover: Secondary Ion Mass Spectrometry SIMS IV - Springer
    A. Benninghoven | J. Okano | R. Shimizu
    Secondary Ion Mass Spectrometry SIMS IV
    Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
    01/2012
    Springer
    9783642822582 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €106.99
    Shipment within 7-9 days
  4. Cover: Microbeam Analysis - CRC Press
    D. Williams | R. Shimizu
    Microbeam Analysis
    Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000
    01/2000
    1st EDN1st Edition
    CRC Press
    9781482289428 (ISBN)
    E-Book
    PDF
    Other editions
    €555.99
    Available for download
  5. Cover: Microbeam Analysis - Institute of Physics Publishing
    D. Williams | R. Shimizu
    Microbeam Analysis
    Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000
    01/2000
    1st EDN1st Edition
    Institute of Physics Publishing
    9780750306850 (ISBN)
    Book
    Hardback
    Other editions
    €623.94
    Article not available at the moment
  6. Cover: Secondary Ion Mass Spectrometry SIMS IV - Springer
    A. Benninghoven | J. Okano | R. Shimizu
    Secondary Ion Mass Spectrometry SIMS IV
    Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
    04/1984
    1st EDN1st Edition
    Springer
    9783540133162 (ISBN)
    Book
    Hardback
    Other editions
    €85.55
    Exhausted; check different version
  7. Cover: Secondary Ion Mass Spectrometry SIMS II - Springer
    A. Benninghoven | C.A. Jr. Evans | R.A. Powell
    Secondary Ion Mass Spectrometry SIMS II
    Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979
    03/1980
    Springer
    9783540098430 (ISBN)
    Book
    Hardback
    Other editions
    €85.55
    Exhausted; check different version