7 results
Type of media (2)
Classification (3)
Year
Persons
Publishers
Sort by
Results per page
Filter
7 results

Your search for Laung-Terng Wang

  1. Cover: System-on-Chip Test Architectures - Morgan Kaufmann
    Laung-Terng Wang | Charles E. Stroud | Nur A. Touba
    System-on-Chip Test Architectures
    Nanometer Design for Testability
    07/2010
    Morgan Kaufmann
    9780080556802 (ISBN)
    E-Book
    PDF
    Other editions
    €62.95
    Available for download
  2. Cover: Electronic Design Automation - Morgan Kaufmann
    Laung-Terng Wang | Yao-Wen Chang | Kwang-Ting (Tim) Cheng
    Electronic Design Automation
    Synthesis, Verification, and Test
    03/2009
    Morgan Kaufmann
    9780080922003 (ISBN)
    E-Book
    ePUB
    Other editions
    €73.95
    Available for download
  3. Cover: VLSI Test Principles and Architectures - Morgan Kaufmann
    Laung-Terng Wang | Cheng-Wen Wu | Xiaoqing Wen
    VLSI Test Principles and Architectures
    Design for Testability
    08/2006
    Morgan Kaufmann
    9780080474793 (ISBN)
    E-Book
    PDF
    Other editions
    €65.95
    Available for download
  4. Cover: Electronic Design Automation - Morgan Kaufmann
    Laung-Terng Wang | Yao-Wen Chang | Kwang-Ting (Tim) Cheng
    Electronic Design Automation
    Synthesis, Verification, and Test
    03/2009
    Morgan Kaufmann
    9780123743640 (ISBN)
    Book
    Hardback
    Other editions
    €101.50
    Shipment within 15-20 days
  5. Cover: System-on-Chip Test Architectures: Volume . - Morgan Kaufmann
    Laung-Terng Wang | Charles E. Stroud | Nur A. Touba
    System-on-Chip Test Architectures: Volume .
    Nanometer Design for Testability
    01/2008
    Morgan Kaufmann
    9780123739735 (ISBN)
    Book
    Hardback
    Other editions
    €79.00
    Shipment within 15-20 days
  6. Cover: VLSI Test Principles and Architectures - Morgan Kaufmann
    Laung-Terng Wang | Cheng-Wen Wu | Xiaoqing Wen
    VLSI Test Principles and Architectures
    Design for Testability
    08/2006
    Morgan Kaufmann
    9780123705976 (ISBN)
    Book
    Hardback
    Other editions
    €83.50
    Shipment within 15-20 days
  7. Cover: VLSI Test Principles and Architectures - Morgan Kaufmann
    Laung-Terng Wang | Cheng-Wen Wu | Xiaoqing Wen
    VLSI Test Principles and Architectures
    Design for Testability
    07/2006
    Morgan Kaufmann
    9781493300860 (ISBN)
    Book
    Paperback/Softback
    Other editions
    €83.50
    Shipment within 15-20 days