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Your search for Erik M. Secula

  1. Cover: Frontiers of Characterization and Metrology for Nanoelectronics - American Institute of Physics
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics
    2009
    11/2009
    1st EDN1st Edition
    American Institute of Physics
    9780735407121 (ISBN)
    Book
    Hardback
    €199.72
    No shipping information available
  2. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics: 2011
    04/2012
    1st EDN1st Edition
    American Institute of Physics
    9780735409736 (ISBN)
    Book
    Mixed media product
    €171.15
    The article will not be published
  3. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Frontiers of Characterization and Metrology for Nanoelectronics
    2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
    10/2007
    1st EDN1st Edition
    American Institute of Physics
    9780735404410 (ISBN)
    Book
    Mixed media product
    €147.50
    No shipping information available
  4. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Robert Mcdonald
    Characterization and Metrology for ULSI Technology 2005
    11/2005
    1st EDN1st Edition
    American Institute of Physics
    9780735402775 (ISBN)
    Book
    Mixed media product
    €327.42
    No shipping information available
  5. This image is currently not available.
    David G. Seiler | Alain C. Diebold | Thomas J. Shaffner
    Characterization and Metrology for ULSI Technology 2000
    International Conference
    04/2001
    1st EDN1st Edition
    American Institute of Physics
    9781563969676 (ISBN)
    Book
    Mixed media product
    €245.03
    No shipping information available